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Dec 30, 2009 Subscribe | Advertising Services | Contact Us

What Can We Get From a Suspect?
By Dick Warrington
Every crime scene is different. Yet, our primary job as crime scene investigators is always the same: to tie a suspect to the scene. The way to accomplish this goal is to collect as much evidence as possible from the scene and the suspect.
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PRODUCT FOCUS

Portable X-ray/Digital Imaging Systems from MinXray

Fast and accurate point-of-study x-ray imaging has never been easier. MinXray’s compact, lightweight portable digital imaging systems combine the speed and high throughput of DR image processing with the power of MinXray portable x-ray equipment. MinXray systems are well suited for either clinical or field setting.

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FORENSIC NEWS
  • Justices Revisit Rule Requiring Lab Testimony
    The Supreme Court will hear arguments on Jan. 11 in a new case that raises questions about how lower courts may carry out its six-month-old precedent set in Melendez-Diaz v. Massachusetts. Many state attorneys general and prosecutors are hoping the court will overrule its decision.
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  • Empty Beer Bottles Make Better Weapons
    Stephan Bolliger, one of Switzerland's leading forensic pathologists, often testifies as an expert witness. Last year he was asked if a beer bottle, when used as a weapon, could crack a human skull. Bolliger set up an experiment, whose results were published in The Journal of Forensic and Legal Medicine.
    read more

  • Soldiers Train To Use Forensic Science to Catch Insurgents
    Intelligence officers with the 2nd Engineer Battalion had a chance to practice identifying and evaluating enemy activities by analyzing evidence found on the battlefield at the National Training Center at Fort Irwin, Calif. They will use these investigative techniques against insurgents when they deploy next year.
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  • NIJ Survey: Unanalyzed Evidence
    In a survey concerning Law Enforcement Forensic Evidence Processing, the NIJ examined the percentage of cases in which evidence collected was not sent to a crime lab and the reasons for not submitting it. The survey provides insight into forensic procedures and prompted recommendations for the future.
    read more

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Industry Calendar

January 10-12, 2010
Epic School at Imaging USA
Nashville, TN

February 10-12, 2010
ACSR Annual Training Conference
San Diego, CA

February 15-16, 2010
International Workshop on Recent Advances in Fingerprints
Allahabad, India

February 17-18, 2010
PEAF 2010 Conference
Orlando, FL

February 22-27, 2010
AAFS
Seattle, WA

March 23-24, 2010
GovSec/U.S. Law Conference
Washington, DC

March 23-24, 2010
Kansas IAI Spring Conference
Manhattan, KS

March 24-26, 2010
Wisconsin Assoc for Identification Conference
Stevens Point, WI

Mar 28 - Apr 1, 2010
7th Annual Advanced DNA Technical Workshop – West
San Diego, CA

April 6-7, 2010
Nebraska Division IAI Annual Conference
Ashland, NE

May 10-12, 2010
Oklahoma Division IAI Annual Training Conference
Edmond, OK

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