2010 Impression & Pattern Evidence Symposium: Call for Abstracts
The nature of pattern, or “impression,” evidence is highly variable, and can be found at nearly every crime or accident scene. Pattern evidence is considered one of the most diverse of the forensic disciplines because it can include the analysis of friction ridge, ballistic, shoe print, tire tread, and document evidence, among others. While pattern evidence is rarely the only evidence available in an investigation, identifying the origin of foreign material found at a crime scene and/or linking such material with that from different locations can be a powerful evidentiary finding.
Recognizing the important impact that pattern evidence has on criminal investigations and, ultimately, on our system of justice, the National Institute of Justice (NIJ), the Bureau of Justice Assistance (BJA), and the Federal Bureau of Investigation (FBI) Laboratory Division will cosponsor a Pattern Evidence Symposium to be held August 2–6, 2010, in Clearwater Beach, Florida. The theme of the 2010 Symposium will be “Pattern Evidence: Foundations for the Future.”
To enhance the awareness of cutting-edge research and casework being conducted in the field of pattern evidence, the NIJ, BJA, and the FBI Laboratory Division announce a call for abstracts for presentation at the Symposium. Presentations in oral format can include pre-symposium workshops, general session, and break-out session topics. Opportunities also exist to present information such as research in the form of a poster at the Symposium.
Suggested topics include (in no particular order) but are not limited to:
New trends/information on traditional topics
Novel research/application of traditional methodologies to enhance investigations
Analysis of atypical materials
Significance of a class association of pattern evidence
Case Studies
Impact of the NAS report
Abstracts must be received by 5:00 PM EST on Friday, January 8, 2010 and submitted via the on-line submission form. For more information, visit http://projects.nfstc.org/ipes/.
